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Filtering by tag: "semiconductor inspection"

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XP Power HRF15 adds digital control for high voltage systems

XP Power introduces digital monitoring and PMBus control to its HRF15 high voltage DC DC converters for precision instrumentation and semiconductor inspection.

xp power, hrf15, high voltage converter, dc dc converter, pmbus, i2c control, precision instrumentation, semiconductor inspection, mass spectrometry, electron microscopy, stability, voltage regulation, power monitoring, digital power control

Toshiba TCD2728DG CCD Sensor Cuts Noise for High-Speed A3 Scanning

Toshiba’s TCD2728DG CCD sensor reduces noise by 40%, speeds up A3 scanning, and simplifies integration for printers and inspection systems.

toshiba, ccd sensor, linear image sensor, a3 multifunction printers, high-speed scanning, noise reduction, semiconductor inspection, food sorting, rgb sensor, image quality, emi reduction, industrial imaging, optical sensors, printer components, inspection equipment

XP Power HRF15 adds digital control for high voltage systems

Toshiba TCD2728DG CCD Sensor Cuts Noise for High-Speed A3 Scanning

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