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Filtering by tag: "jitter analysis"

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Tektronix Brings SEPIA Power Integrity Analysis to Mixed Signal Oscilloscopes

Tektronix has introduced PDN Analysis Software for its 4 Series B, 5 Series B, and 6 Series B Mixed Signal Oscilloscopes. The software embeds SEPIA stability analysis alongside impedance, PSRR, noise, and jitter measurements to evaluate power distribution networks under real transient load conditions.

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Keysight XR8 Scope Architecture Pushes High Speed Validation Forward

Keysight’s Infiniium XR8 oscilloscope introduces a new front end with integrated ADC and DSP processing, reducing noise, accelerating compliance testing, and improving workflow efficiency for high speed digital validation.

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